X-ray diffractional studies for crystal – chemical characterization and quantification of smectites
Authors:
About authors
- University of Mining and Technology
Abstract
To assess the quality of bentonites and their suitability for industrial applications, an accurate determination of the smectite content is required. Up to now, it was not possible to use the standard Rietveld method for quantitative phase analysis of smectite-containing samples because of the turbo-stratum disorder of many natural occurring smectites. In this article, a model is proposed to describe the powder X-ray diffraction patterns of montmorillonite samples measured under room conditions.
Область исследования:
Geology
Funding:
None
Similar articles
Calculations of the radiation heat conduction coefficient in the bed of rods
2007 Dorota Kawka, Rafał Wyczółkowski, Lech Szecówka
Integrated application of horizontal slice maps and optical method to improve the control of development of Tyugeevskoye high-viscosity oil field
2007 A. V. Maksyutin