For realization of potential possibilities of X-ray radiometric analysis with semiconductor detectors (SCD) it is expedient to use program-controlled measuring technique, in which the basic operations on gathering and processing of the information are carried out under the control of microprocessors or microcomputers.

The deposit, where the X-ray radiometric sampling (XRD) of the walls of mine workings was carried out, is confined to the local uplift of the graben-shaped sag, composed of Cretaceous volcanogenic and sedimentary-volcanogenic formations.