Experience of development and results of application of software-controlled X-ray radiometric analyzers for sampling of ores of complex composition
Abstract
For realization of potential possibilities of X-ray radiometric analysis with semiconductor detectors (SCD) it is expedient to use program-controlled measuring technique, in which the basic operations on gathering and processing of the information are carried out under the control of microprocessors or microcomputers.
Область исследования:
(Archived) Without section
Funding:
None
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