Investigation of the surface quality of phototheodolite plates by overhead interferometer IT-33
Authors:
Abstract
The accuracy of coordinates determination from images and determination of internal orientation elements can be significantly affected by the surface quality of photographic plates, which is understood as deviation of their surface on the emulsion side from the plane. This deviation leads to displacement of the image of photographed objects on the negative and to increase of distances between images of coordinate marks of the camera's application frame...
Область исследования:
(Archived) Without section
Funding:
None
References
- Gelman P. N. Taking into account the influence of loose adhesion of the photographic plate during phototheodolite surveying. Geodesy and Cartography, No. 1, 1959.
- Kapustina T. P., Mashekhin V. T. Deformation of thin silicon plates at mechanical processing. University Proc., Instrument Engineering, vol. X, No. 6, 1967,
- Mikhailov V. Ya. Aerophotography and general bases of photography. Geodesizdat, 1959.
- Rassov T. N. Map-making by the method of combined ground and aerial stereophotogrammetric survey. Geodesizdat, 1958.
- Shibanov V. I. About the reasons of “unclamping” of photographic plates in phototheodolites PHOTEO 19/1318. In the collection: Development of mineral deposits, 11. PH Tehnika, 1967.
- Meets W. A., Thiriar L. Silicates industriels, 23, No. 2, 3, 1958.
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