2411-3336 2541-9404 Записки Горного института Journal of Mining Institute Санкт-Петербургский горный университет императрицы Екатерины ΙΙ Empress Catherine II Saint Petersburg Mining University pmi-7706 https://pmi.spmi.ru/pmi/article/view/7706 Геология Geology X-ray diffractional studies for crystal – chemical characterization and quantification of smectites Bause Tim Bause Tim Bause Tim pmi@spmi.ru Горно-технологический университет (Фрайберг, Германия) University of Mining and Technology (Freiberg, Germany) 11 04 2007 2007 170 2 25 29 15 08 2006 30 10 2006 11 04 2007 © 2007 Tim Bause © 2007 Tim Bause 2007 Tim Bause Tim Bause Эта статья доступна по лицензии Creative Commons Attribution 4.0 International (CC BY 4.0) This article is licensed under a Creative Commons Attribution 4.0 International License (CC BY 4.0) https://pmi.spmi.ru/pmi/article/view/7706

Для оценки качества бентонитов и их промышленного использования необходимо точноопределить содержание в них смектита. До настоящего времени было невозможно использовать стандартный метод Ритвелда для количественного фазового анализа смектит-содержащих образцов из-за турбостатического беспорядка большинства природных смектитов. Предлагается модель, позволяющая описать порошковые дифракционные рентгенограммы образцов монтмориллонита, полученные в комнатных условиях.

To assess the quality of bentonites and their suitability for industrial applications, an accurate determination of the smectite content is required. Up to now, it was not possible to use the standard Rietveld method for quantitative phase analysis of smectite-containing samples because of the turbo-stratum disorder of many natural occurring smectites. In this article, a model is proposed to describe the powder X-ray diffraction patterns of montmorillonite samples measured under room conditions.

 Bergmann, J., Kleeberg, R., Taut, T. (1997): Quantitative phase analysis using a new Rietveld algorithm – assisted by improved stability and convergence behavior, Advances in X ray analysis, Vol.40, 425. Ferrage, E., Lanson, B., Sakharov, B.A., Drits, V.A. (2005a): Investigation of smectite hydration properties by modeling experimental X-ray diffraction patterns: Part I. Montmorillonite hydration properties, American Mineralogist, Vol.90, 1358-1374. Guven, N. (1988): Smectites – In: Bailey, S. W. (Hrsg.) (1988): Hydrous phyllosilicates, Reviews in mineralogy Vol.19, Mineralogical Society of America, Washington, 497-559. Koster, H.M. (1977): Die Berechnung kristallchemischer Strukturformeln von 2:1-Schichtsilikaten unter Berucksichtigung der gemessenen Zwischenschichtladungen und Kationenaustauschkapazitaten, sowie die Darstellung der Ladungsverteilung in der Struktur mittels Dreieckskoordinaten, Clay Minerals, Vol.12, 45-54. Meier, J., Kahr, G. (1999): Determination of the cation exchange dapacity (CEC) of clay minerals using the complexes of copper(II) ion with triethylenetetramine and tetraethylenepentamine, Clays and Clay Minerals, Vol.47, 386-388. Moore, D.M., Reynolds, R.C. (1997): X-ray diffraction and the identification and analysis of clay minerals, 2nd edition, Oxford University Press, New York. Ufer, K., Roth, G., Kleeberg, R., Stanjek, H., Dohrmann, R., Bergmann, J. (2004): Description of X-ray powder pattern of turbostratically disordered layer structures with a Rietveld compatible approach, Zeitschrift fur Kristallographie, Vol.219, 519-527. Tsipurski, S.I., Drits, V.A. (1984): The distribution of octahedral cations in the 2:1 layers of dioctahedral smectites studied by oblique-texture electron diffraction, Clay Minerals, Vol.19, 177-193. Warren, B.E. (1941): X-ray diffraction in random layer lattices, Physical Review, Vol. 59, 693-698.