Submit an Article
Become a reviewer
Basic research in natural sciences

Electrical methods for nondestructive quality control of capacitors metal-oxide structures

Authors:
N. S. Pshchelko1
S. D. Khanin2
  • 1 — Saint Petersburg State Mining Institute (Technical University)
  • 2 — Herzen Russian State pedagogical university
Date submitted:
2016-12-08
Date published:
2011-01-01

Abstract

The paper presents a number of experimental techniques for detecting in amorphous tantalum oxide films structural defects, which accelerate film destruction  processes in a strong electric field and  thus are potentially dangerous under prolonged thermoelectric stresses applied to capacitor structures. It is shown that the anomalous frequency dependence of dielectric losses and increase of the leakage current over time can identify potentially unreliable capacitors.

Go to volume 189

Similar articles

The control algorithm reagent conditions of flotation copper-nickel ores on the basis of оptimizing the ionic parameters
2011 A. M. Kurchukov
Value Δ34S in millerite and genesys of clinochlore-brindleyite-chamosite nickel ores in the Elov supergene deposit (North Urals)
2011 O. P. Mezentseva, I. V. Talovina
Basic requirements for shallow seismic field works technique by the reflected waves method for engineering-geological issues solving
2011 A. N. Telegin, A. S. Yakovlev