X-ray diffractional studies for crystal – chemical characterization and quantification of smectites

Tim Bause


To evaluate the quality of bentonites and its suitability for industrial applications, an accurate determination of the smectite content is required. Up to now it was not possible to use the standard Rietveld method for quantitative phase analysis of smectite-containing samples because of the turbostratic disorder of many natural occurring smectites. The article proposes a model allowing a description of under room condition measured X-ray diffraction powder patterns of montmorillonitic samples. 

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